Showing results: 16 - 30 of 316 items found.
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KH3766 -
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
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KH3760 -
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
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KH3763 -
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
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Keysight Technologies
With Keysight Technologies' digital to analog converters, you can control devices under test or simulate sensors in a VXI-based test system.
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Langer EMV-Technik GmbH
The field sources and the burst transformer are used to harden the device under test. They are powered by an EFT/burst generator.
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IRS Systementwicklung GmbH
Electronic control units for automotive applications require extensive validation to make sure that the device will work properly for years under harsh environmental conditions. During validation, inputs and outputs of the device under test (DUT) have to be stimulated and operation has to be monitored continuously.
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S94511B -
Keysight Technologies
The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
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Micran Co. Ltd.
An RF network analyzer used to measure amplitude properties like VSWR and Return loss of Device Under Test.
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U2751A -
Keysight Technologies
The U2751A USB Modular Switch Matrix offers a flexible connection path between the device under test and the test equipment, thus allowing different instruments to be connected to multiple points on the device under test at the same time. This instrument is able to support measurements at a high bandwidth of up to 45MHz. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity
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Test Tooling Solutions Group
Probe pin is also known as pogo pin or spring probe. It is designed to test the connection between two circuit boards and devices or equipment under test.
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CMC 850 -
OMICRON electronics
The CMC 850 is a protection test set dedicated to IEC 61850. It focuses on the real-time communication methods GOOSE and Sampled Values to interface with the devices under test.
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Martin Testing Laboratories
Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Langer EMV-Technik GmbH
Mini burst field generators are small and handy burst generators used to detect weak spots in the device under test.
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Teradyne, Inc.
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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6TL Engineering
Capable of performing the necessary switching between test points of the device under test, to give access to low frequency measuring instruments, in electronic test systems based on tool receivers.
